Waring: This dataset is still under preparation an not published yet!

Single layer fits of XRR measurements of softmatter thinfilms

This is a compiled dataset of raw XRR measurements together with corresponding fit parameters, intentionally published to use as training or test data for machine learning models.

Data structure

All data is provided in an hdf5 file, follwing NeXus convention with respect to the provied metadata in the hdf5 attributes. The datesets have been measured in-situ and therefore there are always stacks of curves that correspond to the diffrent layer thicknesses of the same material on top of $SiO_x$. The measured data is provied under experimental and the corresponding fit parameters under fit. Additional information is collected in metadata.

image-2.png

Layer model

The follwing model was used:

Air
layer 1: thicknes, roughness and SLD fitted
$SiO_x$: thicknes, roughness and SLD kept constant for each stack
$Si$: roughness and SLD kept constant

Limited q-range of fits

For all provied fits the q-range during fitting was limited form $q_{min} = 0.0 {\mathring{A}}^{-1}$ to $q_{max} = ?? {\mathring{A}}^{-1}$.

How to cite this data

Please consider citing the the folloing publication: ###

The dataset itself can be cited via the zenodo doi ###

Where to find the dataset and how to contribute

Have a look at github ### and zenodo ###. In case you wish to add further data to this repository, please use github pull requests and provide feedback through github issuse.

Interactive presentation of the data

DIP Dataset (1)

use the slider to browse through the curves corresponding to different layer thickness.

DIP Dataset (2)

DIP Dataset (3)

Ideas to improve