Single layer fits of XRR measurements of softmatter thinfilms¶
This is a compiled dataset of raw XRR measurements together with corresponding fit parameters, intentionally published to use as training or test data for machine learning models.
Data structure¶
All data is provided in an hdf5 file, follwing NeXus convention with respect to the provied metadata in the hdf5 attributes. The datesets have been measured in-situ and therefore there are always stacks of curves that correspond to the diffrent layer thicknesses of the same material on top of $SiO_x$. The measured data is provied under experimental and the corresponding fit parameters under fit. Additional information is collected in metadata.
Layer model¶
The follwing model was used:
| Air | |
|---|---|
| layer 1: thicknes, roughness and SLD fitted | |
| $SiO_x$: thicknes, roughness and SLD kept constant for each stack | |
| $Si$: roughness and SLD kept constant |
Limited q-range of fits¶
For all provied fits the q-range during fitting was limited form $q_{min} = 0.0 {\mathring{A}}^{-1}$ to $q_{max} = ?? {\mathring{A}}^{-1}$.